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Influence of temperature on microelectronics and system reliability [Book] / Pradeep Lall, Michael G. Pecht, Edward B. Hakim.
Material type:
TextSeries: Publication details: Boca Raton : CRC Press, c1997.Description: 307 p. : ill. ; 26 cmISBN: - 0849394503 (acid-free paper)
- 621.381 046 20
- 621.381046
| Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
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Junaid Zaidi Library, COMSATS University Islamabad Ground Floor | 621.381046 LAL-I (Browse shelf(Opens below)) | Available | 13287 |
Total holds: 0
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| 621.381046 FLI Flip chip technologies | 621.381046 GIL-M MEMS/MOEMS packaging concepts, designs, metarials, and processes / | 621.381046 JAM-P Practical guide to the packaging of electronics thermal and mechanical design and analysis / | 621.381046 LAL-I Influence of temperature on microelectronics and system reliability | 621.381046 LAU-M Microvias for low cost, high density interconnects / | 621.381046 LEA Lead-free soldering in electronics science, technology and environmental impact / | 621.381046 LEA Lead-free soldering in electronics science, technology and environmental impact / |
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