Influence of temperature on microelectronics and system reliability [Book] / Pradeep Lall, Michael G. Pecht, Edward B. Hakim.

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Material type: Text

TextSeries: Publication details: Boca Raton : CRC Press, c1997.Description: 307 p. : ill. ; 26 cmISBN:

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Junaid Zaidi Library, COMSATS University Islamabad	621.381046 LAL-I (Browse shelf(Opens below))	Available		13287

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