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Influence of temperature on microelectronics and system reliability

Lall, Pradeep.

Influence of temperature on microelectronics and system reliability [Book] / Pradeep Lall, Michael G. Pecht, Edward B. Hakim. - Boca Raton : CRC Press, c1997. - 307 p. : ill. ; 26 cm. - The electronic packaging series. .

All.

ISBN: 0849394503 (acid-free paper)

Subjects--Topical Terms:
Microelectronics--Materials--Thermal properties.
Electronic packaging.
Electronic apparatus and appliances--Reliability.

Dewey Class. No.: 621.381 046

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