Hot-carrier effects in MOS devices [Book] / Eiji Takeda, Cary Y. Yang, Akemi Miura-Hamada.

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Material type: Text

TextPublication details: San Diego : Academic Press, c1995.Description: xii, 312 p. : ill. ; 24 cmISBN:

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Junaid Zaidi Library, COMSATS University Islamabad Ground Floor	537.6225 TAK-H (Browse shelf(Opens below))	Available		24582

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