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Hot-carrier effects in MOS devices

Takeda, Eiji, 1944-

Hot-carrier effects in MOS devices [Book] / Eiji Takeda, Cary Y. Yang, Akemi Miura-Hamada. - San Diego : Academic Press, c1995. - xii, 312 p. : ill. ; 24 cm.

All.

ISBN: 0126822409 (acid-free paper)

Subjects--Topical Terms:
Metal oxide semiconductors.
Hot carriers.

Dewey Class. No.: 537.6225

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