Influence of temperature on microelectronics and system reliability [Book] / Pradeep Lall, Michael G. Pecht, Edward B. Hakim.

By:

Contributor(s):

Material type: Text

TextSeries: Publication details: Boca Raton : CRC Press, c1997.Description: 307 p. : ill. ; 26 cmISBN:

Subject(s):

DDC classification:

Other classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Junaid Zaidi Library, COMSATS University Islamabad Ground Floor	621.381046 LAL-I (Browse shelf(Opens below))	Available		13287

Total holds: 0

All.

There are no comments on this title.

to post a comment.