Nanometer technology designs [Book] : high-quality delay tests / Mohammad Tehranipoor, Nisar Ahmed.

By:

Tehranipoor, Mohammad H, 1974-

Contributor(s):

Ahmed, Nisar

Material type: Text

TextPublication details: New York, NY : Springer, c2008.Description: xvii, 281 p. : ill. ; 25 cmISBN:

0387764860 (hdbk. : acid-free paper)
9780387764863 (hdbk. : acid-free paper)

Subject(s):

DDC classification:

621.381548 22

Other classification:

621.381548

Summary: Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Junaid Zaidi Library, COMSATS University Islamabad Ground Floor	621.381548 TEH-N (Browse shelf(Opens below))	Available		43954

Total holds: 0

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Previous	621.381548 NOR-I Introduction to instrumentation and measurements	621.381548 PRA Practical design verification	621.381548 RAT-D Digital measurement techniques	621.381548 TEH-N Nanometer technology designs high-quality delay tests /	621.3815486 CHE-F Frequency synthesizers concept to product /	621.3815486 EGA-F Frequency synthesis by phase lock	621.3815486 GOL-D Digital frequency synthesis demystified DDS and fractional-N PLLs /	Next

Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

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