MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01621cam a22002897a 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
0000060776 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
0001 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
070926s2008 nyua 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0387764860 (hdbk. : acid-free paper) |
|
|---|
| International Standard Book Number |
9780387764863 (hdbk. : acid-free paper) |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(OCoLC)ocn183259720 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
BTCTA |
| Transcribing agency |
BTCTA |
| Modifying agency |
BAKER |
| -- |
YDXCP |
| -- |
NLGGC |
| -- |
IUP |
| -- |
CUY |
| -- |
OCLCG |
| -- |
STF |
| -- |
AU@ |
| -- |
DLC |
| 042 ## - AUTHENTICATION CODE |
|---|
| Authentication code |
lccopycat |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.381548 |
| Edition number |
22 |
| 084 ## - OTHER CLASSIFICATION NUMBER |
|---|
| Classification number |
621.381548 |
| Item number |
TEH-N |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Tehranipoor, Mohammad H., |
| Dates associated with a name |
1974- |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Nanometer technology designs |
| Medium |
[Book] : |
| Remainder of title |
high-quality delay tests / |
| Statement of responsibility, etc. |
Mohammad Tehranipoor, Nisar Ahmed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
New York, NY : |
| Name of publisher, distributor, etc. |
Springer, |
| Date of publication, distribution, etc. |
c2008. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xvii, 281 p. : |
| Other physical details |
ill. ; |
| Dimensions |
25 cm. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test. |
| 521 ## - TARGET AUDIENCE NOTE |
|---|
| Target audience note |
All. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Integrated circuits |
| General subdivision |
Testing. |
|
|---|
| Topical term or geographic name entry element |
Integrated circuits |
| General subdivision |
Very large scale integration. |
|
|---|
| Topical term or geographic name entry element |
Nanotechnology. |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Ahmed, Nisar. |
| 852 ## - LOCATION |
|---|
| Piece designation |
43954 |
| -- |
11961.22 |
| Classification part |
621.381548 TEH-N |
| Sublocation or collection |
Ground Floor |
| Former shelving location |
Books |
| Copy number |
1 |
| Piece physical condition |
1-New |
| Location |
JZL-CUI |
