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Principles of semiconductor network testing [Book] / Amir Afshar.
Material type:
TextPublication details: Boston : Butterworth-Heinemann, c1995.Description: xiv, 213 p. : ill. ; 25 cmISBN: - 0750694726 (hardcover : alk. paper)
- 621.381548 20
- 621.381548
| Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
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Junaid Zaidi Library, COMSATS University Islamabad Ground Floor | 621.381548 AFS-P (Browse shelf(Opens below)) | Available | 20471 | ||
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Junaid Zaidi Library, COMSATS University Islamabad Ground Floor | 621.381548 AFS-P (Browse shelf(Opens below)) | Available | 22307 |
Total holds: 0
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| 621.381542 ORG Organic photovoltaics mechanism, materials, and devices / | 621.381542 ROB-H High-speed heterostructure devices from device concepts to circuit modeling / | 621.381548 AFS-P Principles of semiconductor network testing | 621.381548 AFS-P Principles of semiconductor network testing | 621.381548 BAK-E Electrical and electronics measuring instruments | 621.381548 BEL-E Electronic instrumentation and measurements | 621.381548 ELE Electron beam testing technology |
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