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Principles of semiconductor network testing

Afshar, Amir.

Principles of semiconductor network testing [Book] / Amir Afshar. - Boston : Butterworth-Heinemann, c1995. - xiv, 213 p. : ill. ; 25 cm.

All.

ISBN: 0750694726 (hardcover : alk. paper)

Subjects--Topical Terms:
Integrated circuits--Testing.
Semiconductors--Testing.

Dewey Class. No.: 621.381548

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