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Fundamentals of nanoscale film analysis [Book] / Terry L. Alford, Leonard C. Feldman and James W. Mayer.
Material type:
TextPublication details: New York, N.Y. ; London : Springer, c2007.Description: xiv, 336 p. : ill. ; 25 cmISBN: - 9780387292601
- 620.5 22
- 620.5
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Junaid Zaidi Library, COMSATS University Islamabad Ground Floor | 620.5 ALF-F (Browse shelf(Opens below)) | Available | 28376 | ||
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Junaid Zaidi Library, COMSATS University Islamabad Ground Floor | 620.5 ALF-F (Browse shelf(Opens below)) | Available | 28977 | ||
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Books
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Junaid Zaidi Library, COMSATS University Islamabad Ground Floor | 620.5 ALF-F (Browse shelf(Opens below)) | Available | 29013 |
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| 620.44 WAN-R Reflection electron microscopy and spectroscopy for surface analysis | 620.5 ALF-F Fundamentals of nanoscale film analysis | 620.5 ALF-F Fundamentals of nanoscale film analysis | 620.5 ALF-F Fundamentals of nanoscale film analysis | 620.5 ATK-N Nanotechnology nanocosm and the big changes coming from the inconceivably small / | 620.5 BAG-S Scaling issues and design of MEMS | 620.5 BAG-S Scaling issues and design of MEMS |
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