Fundamentals of nanoscale film analysis

Alford, Terry L.

Fundamentals of nanoscale film analysis [Book] / Terry L. Alford, Leonard C. Feldman and James W. Mayer. - New York, N.Y. ; London : Springer, c2007. - xiv, 336 p. : ill. ; 25 cm.

Index includes

All.

9780387292601

GBA631488 bnb

013426036 Uk


Thin films.
Nanostructured materials.

620.5