| 000 | 01765cam a22002775a 4500 | ||
|---|---|---|---|
| 001 | 0000061660 | ||
| 003 | 0001 | ||
| 008 | 070717s2008 nyua 000 0 eng | ||
| 020 | _a9783540738855 (acid-free) | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 082 | 0 | 0 |
_a620.1 1299 _222 |
| 084 |
_a620.11299 _bFUL-T |
||
| 100 | 1 |
_aFultz, B. _q(Brent) |
|
| 245 | 1 | 0 |
_aTransmission electron microscopy and diffractometry of materials _h[Book] / _cBrent Fultz, James M. Howe. |
| 250 | _a3rd ed. | ||
| 260 |
_aBerlin ; _aNew York : _bSpringer, _cc2008. |
||
| 300 |
_axix, 758 p. : _bill. ; _c24 cm. |
||
| 490 | 0 |
_aAdvanced texts in physics ; _v1439-2674 |
|
| 520 | _aThis hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. | ||
| 521 | _aAll. | ||
| 650 | 0 |
_aMaterials _xMicroscopy. |
|
| 650 | 0 | _aTransmission electron microscopy. | |
| 650 | 0 | _aX-ray diffractometer. | |
| 700 | 1 |
_aHowe, James M., _d1955- |
|
| 852 |
_p44873 _96727.81 _h620.11299 FUL-T _vBook Field International _bGround Floor _dBooks _t1 _q2-Good _aJZL-CUI |
||
| 999 |
_c74765 _d74765 |
||