| 000 | 00834pam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | 0000046568 | ||
| 003 | 0001 | ||
| 008 | 961121s1997 enka b 001 0 eng | ||
| 015 | _aGB97-53484 | ||
| 020 | _a0471954829 (alk. paper) | ||
| 040 |
_aDLC _cDLC _dYDX _dUKM _dCIN |
||
| 082 | 0 | 0 |
_a621.3815 2 _221 |
| 084 |
_a621.38152 _bAME-F |
||
| 100 | 1 | _aAmerasekera, E. A. | |
| 245 | 1 | 0 |
_aFailure mechanisms in semiconductor devices _h[Book] / _cE. Ajith Amerasekera, Farid N. Najm. |
| 250 | _a2nd ed. | ||
| 260 |
_aChichester ; _aNew York : _bJ. Wiley, _cc1997. |
||
| 300 |
_axii, 345 p. : _bill. ; _c24 cm. |
||
| 500 | _asubject index includes | ||
| 521 | _aAll. | ||
| 650 | 0 |
_aSemiconductors _xFailures. |
|
| 700 | 1 | _aNajm, Farid N. | |
| 852 |
_p24532 _90.00 _dBooks |
||
| 999 |
_c161556 _d161556 |
||