| 000 | 00779pam a2200217 a 4500 | ||
|---|---|---|---|
| 001 | 0000052165 | ||
| 003 | 0001 | ||
| 008 | 970422s1997 si a b 101 0 eng | ||
| 020 | _a9810229186 | ||
| 082 | 0 | 0 |
_a530.80151 _221 |
| 084 |
_a530.80151 _bADV |
||
| 245 | 0 | 0 |
_aAdvanced mathematical tools in metrology III _h[Book] / _ceditors, P. Ciarlini ... [et al.]. |
| 260 |
_aSingapore : _bWorld Scientific, _cc1997. |
||
| 300 |
_ax, 284 p. : _bill. ; _c23 cm. |
||
| 440 | 0 |
_aSeries on advances in mathematics for applied sciences ; _vv. 45 |
|
| 521 | _aAll. | ||
| 650 | 0 |
_aMeasurement _vCongresses. |
|
| 650 | 0 |
_aPhysical measurements _vCongresses. |
|
| 700 | 1 | _aCiarlini, P. | |
| 852 |
_p20355 _90.00 _dBooks |
||
| 999 |
_c158982 _d158982 |
||