000 | 01122cam a22002897a 4500 | ||
---|---|---|---|
001 | 0000043477 | ||
003 | 0001 | ||
008 | 071005s2008 enk b 001 0 eng | ||
020 | _a9780470027844 (cloth) | ||
020 | _a9780470027851 (pbk.) | ||
040 |
_aDLC _beng _cDLC _dDLC |
||
082 | 0 | 0 |
_a620.11299 _222 |
084 |
_a620.11299 _bBRA-M |
||
100 | 1 | _aBrandon, David | |
245 | 1 | 0 |
_aMicrostructural characterization of materials _h[Book] / _cDavid Brandon and Wayne Kaplan. |
250 | _a2nd ed. | ||
260 |
_aChichester, England : _bJohn Wiley & Sons, _cc2008. |
||
300 |
_axiv, 536 p. : _bill. (some col.) ; _c25 cm. |
||
490 | 0 | _aQuantitative software engineering series | |
521 | _aAll. | ||
650 | 0 |
_aMaterials _xMicroscopy. |
|
650 | 0 | _aMicrostructure. | |
700 | 1 | _aKaplan, Wayne D. | |
852 |
_p41378 _90.00 _dBooks |
||
852 |
_p30412 _90.00 _dBooks |
||
852 |
_p41429 _90.00 _dBooks |
||
999 |
_c158710 _d158710 |