000 01122cam a22002897a 4500
001 0000043477
003 0001
008 071005s2008 enk b 001 0 eng
020 _a9780470027844 (cloth)
020 _a9780470027851 (pbk.)
040 _aDLC
_beng
_cDLC
_dDLC
082 0 0 _a620.11299
_222
084 _a620.11299
_bBRA-M
100 1 _aBrandon, David
245 1 0 _aMicrostructural characterization of materials
_h[Book] /
_cDavid Brandon and Wayne Kaplan.
250 _a2nd ed.
260 _aChichester, England :
_bJohn Wiley & Sons,
_cc2008.
300 _axiv, 536 p. :
_bill. (some col.) ;
_c25 cm.
490 0 _aQuantitative software engineering series
521 _aAll.
650 0 _aMaterials
_xMicroscopy.
650 0 _aMicrostructure.
700 1 _aKaplan, Wayne D.
852 _p41378
_90.00
_dBooks
852 _p30412
_90.00
_dBooks
852 _p41429
_90.00
_dBooks
999 _c158710
_d158710