| 000 | 00877cam a22002534a 4500 | ||
|---|---|---|---|
| 001 | 0000044271 | ||
| 003 | 0001 | ||
| 008 | 040105s2004 gw a b 001 0 eng | ||
| 020 | _a3540206620 (alk. paper) | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 042 | _apcc | ||
| 082 | 0 | 0 |
_a620.5 _222 |
| 084 |
_a620.5 _bNAN |
||
| 245 | 0 | 0 |
_aNanoscale characterisation of ferroelectric materials _h[Book] : _bscanning probe microscopy approach / _cM. Alexe, A. Gruverman, eds. |
| 260 |
_aBerlin ; _aNew York : _bSpringer-Verlag, _cc2004. |
||
| 300 |
_axiii, 282 p. : _bill. (some col.) ; _c24 cm. |
||
| 440 | 0 | _aNanoscience and technology | |
| 521 | _aAll. | ||
| 650 | 0 | _aNanostructured materials. | |
| 650 | 0 | _aNanotechnology. | |
| 700 | 1 |
_aAlexe, M. _q(Marin) |
|
| 700 | 1 |
_aGruverman, A. _q(Alexei) |
|
| 852 |
_p20596 _90.00 _dBooks |
||
| 999 |
_c155019 _d155019 |
||