000 01040cam a22002654a 4500
001 0000046680
003 0001
008 021105s2003 gw a b 001 0 eng
020 _a3540426957
040 _aDLC
_cDLC
_dDLC
042 _apcc
082 0 0 _a621.38152
_221
084 _a621.38152
_bSPA-P
100 1 _aSpaeth, J.-M.
245 1 0 _aPoint defects in semiconductors and insulators
_h[Book] :
_bdetermination of atomic and electronic structure from paramagnetic hyperfine interactions /
_cJ.-M. Spaeth, H. Overhof.
260 _aBerlin ;
_aNew York :
_bSpringer,
_cc2003.
300 _axi, 490 p. :
_bill. ;
_c24 cm.
490 1 _aSpringer series in materials science ;
_x0933-033X ;
_v51
521 _aAll.
650 0 _aSemiconductors
_xDefects.
650 0 _aSemiconductors
_xTesting
_xMethodology.
650 0 _aNuclear magnetic resonance spectroscopy.
700 1 _aOverhof, H.
_q(Harald),
_d1942-
852 _p12212
_95008.82
_vEagle Information Marketing
_dBooks
999 _c149901
_d149901