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	1.	Testing of digital systems [Book] / N.K. Jha and S. Gupta. by Jha, Niraj K Gupta, S. (Sandeep), 1962- Material type: Text; Format: print ; Literary form: Not fiction Publication details: Cambridge : Cambridge University Press, 2003 Availability: Items available for loan: Junaid Zaidi Library, COMSATS University Islamabad (1)Call number: 621.381548 JHA-T. Place hold Add to cart (remove)
	2.	Signal processing of power quality disturbances [Book] Math H. J. Bollen. by Bollen, Math H. J Material type: Text Publication details: John Wiley & Sons Inc. Publications Canada Availability: Items available for loan: COMSATS University Abbottabad Campus (2)Call number: 621.3815 BOL, ... Place hold Add to cart (remove)
	3.	RF measurements for cellular phones and wireless data systems [Book] / Allan W. Scott, Rex Frobenius. by Scott, Allan W Frobenius, Rex Material type: Text; Format: print ; Literary form: Not fiction Publication details: Hoboken, N.J. : Wiley & Sons, c2008 Availability: Items available for loan: Junaid Zaidi Library, COMSATS University Islamabad (1)Call number: 621.38456 SCO-R. Place hold Add to cart (remove)
	4.	Principles of semiconductor network testing [Book] / Amir Afshar. by Afshar, Amir Material type: Text; Format: print ; Literary form: Not fiction Publication details: Boston : Butterworth-Heinemann, c1995 Availability: Items available for loan: Junaid Zaidi Library, COMSATS University Islamabad (2)Call number: 621.381548 AFS-P, ... Place hold Add to cart (remove)
	5.	Nanometer technology designs [Book] : high-quality delay tests / Mohammad Tehranipoor, Nisar Ahmed. by Tehranipoor, Mohammad H, 1974- Ahmed, Nisar Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York, NY : Springer, c2008 Availability: Items available for loan: Junaid Zaidi Library, COMSATS University Islamabad (1)Call number: 621.381548 TEH-N. Place hold Add to cart (remove)
	6.	An introduction to mixed-signal IC test and measurement [Book] / Mark Burns, and Gordon W. Roberts. by Burns, Mark, 1959- Roberts, Gordon W Material type: Text; Literary form: Not fiction Publication details: New Delhi : Oxford University Press, c2001 Availability: Items available for loan: Junaid Zaidi Library, COMSATS University Islamabad (2)Call number: 621.3822 BUR-I, ... Place hold Add to cart (remove)
	7.	Integrated circuit manufacturability [Book] : the art of process and design integration / edited by Jos ̌Pineda de Gyvez, Dhiraj Pradhan. by Pineda de Gyvez, Jos.̌ Pradhan, Dhiraj K Material type: Text; Format: print ; Literary form: Not fiction Publication details: Piscataway, NJ : New York : IEEE Press ; Institute of Electrical and Electronics Engineers, c1999 Availability: Items available for loan: Junaid Zaidi Library, COMSATS University Islamabad (2)Call number: 621.3815 INT, ... Place hold Add to cart (remove)
	8.	Integrated circuit design, fabrication, and test [Book] / Peter Shepherd. by Shepherd, Peter (Peter R.) Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : McGraw-Hill, c1996 Availability: Items available for loan: Junaid Zaidi Library, COMSATS University Islamabad (1)Call number: 621.3815 SHE-I. Place hold Add to cart (remove)
	9.	Fault diagnosis of digital circuits [Book] / V. N. Yarmolik. by Yarmolik, V. N. (Vi︠a︡cheslav Nikolaevich) Material type: Text; Format: print ; Literary form: Not fiction Publication details: Chichester ; New York : John Wiley & Sons, ;, c1990 Availability: Items available for loan: Junaid Zaidi Library, COMSATS University Islamabad (1)Call number: 621.3815 YAR-F. Place hold Add to cart (remove)
	10.	Fault diagnosis and testing of digital circuits with an introduction to error control coding [Book] a practical approach Altaf Mukati. by Altaf Mukati Material type: Text Publication details: Higher Education Commission Islamabad Pakistan Availability: Items available for loan: COMSATS University Abbottabad Campus (3)Call number: 621.3815 ALT, ... Place hold Add to cart (remove)
	11.	Digital systems testing and testable design [Book] Miron Abramovici. by Abramovici, Miron Material type: Text Publication details: Jaico Publishing House New Delhi Availability: Items available for loan: COMSATS University Abbottabad Campus (2)Call number: 621.395 ABR, ... Place hold Add to cart (remove)
	12.	Data mining and diagnosing IC fails [Book] / Leendert M. Huisman. by Huisman, Leendert M Series: Frontiers in electronic testing Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : Springer, 2005 Online access: Publisher description Table of contents only Availability: Items available for loan: Junaid Zaidi Library, COMSATS University Islamabad (1)Call number: 621.381548 HUI-D. Place hold Add to cart (remove)