Transmission electron microscopy of silicon VLSI circuits and structures [Book] / R.B. Marcus and T.T. Sheng.

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TextPublication details: New York : John Wiley & Sons, c1983.Description: x, 217 p. : ill. ; 29 cmISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Junaid Zaidi Library, COMSATS University Islamabad Ground Floor	621.38173 MAR-T (Browse shelf(Opens below))	Available		24899

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