X-ray metrology in semiconductor manufacturing [Book] / D. Keith Bowen, Brian K. Tanner.

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TextPublication details: Boca Raton : CRC/Taylor & Francis, 2006.Description: 279 p. : ill. ; 25 cmISBN:

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Junaid Zaidi Library, COMSATS University Islamabad Ground Floor	621.38152 BOW-X (Browse shelf(Opens below))	Available		27944

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