X-ray metrology in semicaonductor manufacturing [Book] D. Kaith Bowen.

By: Material type: TextTextPublication details: Taylor & Francis New YorkISBN:
  • 849339286
Subject(s): DDC classification:
  • 621.38152
Other classification:
  • 621.38152
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Item type Current library Call number Status Date due Barcode Item holds
Books Books COMSATS University Abbottabad Campus 621.38152 BOW (Browse shelf(Opens below)) Available 10003000013410
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