X-ray metrology in semicaonductor manufacturing [Book] D. Kaith Bowen.
Material type: TextPublication details: Taylor & Francis New YorkISBN:- 849339286
- 621.38152
- 621.38152
Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|
Books | COMSATS University Abbottabad Campus | 621.38152 BOW (Browse shelf(Opens below)) | Available | 10003000013410 |
Total holds: 0
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