Crouch ,Alfred L. <br/><br/>
Design for test 

 - Nwe Delhi  Pearson Education Publisher 
 - Soft Binding  xxviii    348 
<br/><br/><br/>English 
<br/><br/><label>ISBN: </label>81-317-1789-5 
<br/><br/><label>Subjects--Topical Terms: </label>--Design-for- test for digital IC
<br/><br/><label>Dewey Class. No.: </label>621.395    -D