Brandon, David <br/><br/>
Microstructural characterization of materials  [Book] / 
David Brandon and Wayne Kaplan. 
 - 2nd ed. 
 - Chichester, England :  John Wiley & Sons,  c2008. 
 - xiv, 536 p. :  ill. (some col.) ;  25 cm. 
 - Quantitative software engineering series .
<br/><br/>Includes bibliographical references and index. 
<br/><br/> All. 
<br/><br/><label>ISBN: </label>9780470027844 (cloth) 9780470027851 (pbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials--Microscopy.<br/>Microstructure.
<br/><br/><label>Dewey Class. No.: </label>620.11299