Reimer, Ludwig,  1928- <br/><br/>
Scanning electron microscopy  physics of image formation and microanalysis /  [Book] : 
Ludwig Reimer. 
 - 2nd completely rev. and updated ed. 
 - Berlin ;  New York :  Springer,  c1998. 
 - xiv, 527 p. :  ill. ;  24 cm. 
 - Springer series in optical sciences ;  v. 45 .
<br/><br/> All. 
<br/><br/><label>ISBN: </label>3540639764 (hardcover ; alk. paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning electron microscopy.
<br/><br/><label>Dewey Class. No.: </label>502.8 25