Afshar, Amir. <br/><br/>
Principles of semiconductor network testing  [Book] / 
Amir Afshar. 
 - Boston :  Butterworth-Heinemann,  c1995. 
 - xiv, 213 p. :  ill. ;  25 cm. 
<br/><br/> All. 
<br/><br/><label>ISBN: </label>0750694726 (hardcover : alk. paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Testing.<br/>Semiconductors--Testing.
<br/><br/><label>Dewey Class. No.: </label>621.381548