Backscattered scanning electron microscopy and image analysis of sediments and sedimentary rocks  [Book] / 
David H. Krinsley ... [et al.]. 
 - Cambridge, U.K. ;  New York :  Cambridge University Press,  1998. 
 - ix, 193 p. :  ill. ;  26 cm. 
<br/><br/> Includes biblography and index 
<br/><br/> All. 
<br/><br/><label>ISBN: </label>0521453461 (hbk) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Sedimentary rocks Analysis.<br/>Sediments (Geology) Analysis.<br/>Scanning electron microscopy.
<br/><br/><label>Dewey Class. No.: </label>