Takeda, Eiji,  1944- <br/><br/>
Hot-carrier effects in MOS devices  [Book] / 
Eiji Takeda, Cary Y. Yang, Akemi Miura-Hamada. 
 - San Diego :  Academic Press,  c1995. 
 - xii, 312 p. :  ill. ;  24 cm. 
<br/><br/> All. 
<br/><br/><label>ISBN: </label>0126822409 (acid-free paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors.<br/>Hot carriers.
<br/><br/><label>Dewey Class. No.: </label>537.6225