Semiconductor characterization techniques  proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices  /  [Book] : 
edited by Peter A. Barnes, George A. Rozgonyi, assistant editors, C. L. Anderson ... [et al. ; sponsored by] Elecronics Division. 
 - Princeton, N.J. :  Electrochemical Society,  c1978. 
 - xi, 532 p. :  ill. ;  23 cm. 
 - Proceedings - The Electrochemical Society ; v. 78-3 .
<br/><br/> All. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Testing--Congresses.
<br/><br/><label>Dewey Class. No.: </label>621.38152