Spaeth, J.-M. <br/><br/>
Point defects in semiconductors and insulators  determination of atomic and electronic structure from paramagnetic hyperfine interactions  /  [Book] : 
J.-M. Spaeth, H. Overhof. 
 - Berlin ;  New York :  Springer,  c2003. 
 - xi, 490 p. :  ill. ;  24 cm. 
 - Springer series in materials science ;  51  0933-033X ; .
<br/><br/> All. 
<br/><br/><label>ISBN: </label>3540426957 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Defects.<br/>Semiconductors--Testing--Methodology.<br/>Nuclear magnetic resonance spectroscopy.
<br/><br/><label>Dewey Class. No.: </label>621.38152