Optical imaging and microscopy  techniques and advanced systems /  [Book] : 
Peter Tr̲k̲, Fu-Jen Kao, [editors]. 
 - 2nd rev. ed. 
 - Berlin ;  New York :  Springer,  c2007. 
 - xix, 497 p. :  ill. (some col.) ;  24 cm. 
 - Springer series in optical sciences,  v. 87.  0342-4111 ; .
<br/><br/> All. 
<br/><br/><label>ISBN: </label>9783540695639 (hd.bd.) 354069563X (hd.bd.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Optoelectronic devices.<br/>Microscopy.<br/>Imaging systems.
<br/><br/><label>Dewey Class. No.: </label>621.381045