Lall, Pradeep. <br/><br/>
Influence of temperature on microelectronics and system reliability  [Book] / 
Pradeep Lall, Michael G. Pecht, Edward B. Hakim. 
 - Boca Raton :  CRC Press,  c1997. 
 - 307 p. :  ill. ;  26 cm. 
 - The electronic packaging series. .
<br/><br/> All. 
<br/><br/><label>ISBN: </label>0849394503 (acid-free paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronics--Materials--Thermal properties.<br/>Electronic packaging.<br/>Electronic apparatus and appliances--Reliability.
<br/><br/><label>Dewey Class. No.: </label>621.381 046