An introduction to mixed-signal IC test and measurement [Book] / Mark Burns, and Gordon W. Roberts.

By:

Burns, Mark, 1959-

Contributor(s):

Roberts, Gordon W

Material type: Text

TextPublication details: New Delhi : Oxford University Press, c2001.Description: xx, 684 pISBN:

9780198064152

Subject(s):

DDC classification:

621.3822

Other classification:

621.3822

Summary: "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher.

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	Junaid Zaidi Library, COMSATS University Islamabad Ground Floor	621.3822 BUR-I (Browse shelf(Opens below))	Available		45839
Books	Junaid Zaidi Library, COMSATS University Islamabad Ground Floor	621.3822 BUR-I (Browse shelf(Opens below))	Available		48778

Total holds: 0

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Previous	621.3822 BOC-S Signal processing for wireless communications	621.3822 BRA-D Discover signal processing an interactive guide for engineers /	621.3822 BRO-I Introduction to random signals and applied Kalman filtering with MATLAB exercises and solutions /	621.3822 BUR-I An introduction to mixed-signal IC test and measurement	621.3822 BUR-I An introduction to mixed-signal IC test and measurement	621.3822 CAN-M Model-based signal processing	621.3822 CAV-D Digital signal processing	Next

"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher.

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