Microstructural characterization of materials [Book] / David Brandon and Wayne Kaplan.
Material type: TextSeries: Quantitative software engineering seriesPublication details: Chichester, England : John Wiley & Sons, c2008.Edition: 2nd edDescription: xiv, 536 p. : ill. (some col.) ; 25 cmISBN:- 9780470027844 (cloth)
- 9780470027851 (pbk.)
- 620.11299 22
- 620.11299
Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|
Books | Junaid Zaidi Library, COMSATS University Islamabad | 620.11299 BRA-M (Browse shelf(Opens below)) | Available | 41378 | ||
Books | Junaid Zaidi Library, COMSATS University Islamabad | 620.11299 BRA-M (Browse shelf(Opens below)) | Available | 41429 |
Total holds: 0
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620.11297 NEG Negative-refraction metamaterials fundamental properties and applications / | 620.11297 SAR-E Electrodynamics of metamaterials | 620.11297 SOL-E Electrical properties of materials | 620.11299 BRA-M Microstructural characterization of materials | 620.11299 BRA-M Microstructural characterization of materials | 620.11299 BRA-M Microstructural characterization of materials | 620.11299 BRA-M Microstructural characterization of materials |
Includes bibliographical references and index.
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