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A+ exam cram [Book] / James Jones, Craig Landes.
Material type:
TextSeries: Exam cram 2Publication details: Indianapolis, IN : Que Pub., c2003.Description: xxxviii, 749 p. : ill. ; 23 cm. + 1 CD-ROM (4 3/4 in.)ISBN: - 0789728672
- 004.16 22
- 004.16
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Junaid Zaidi Library, COMSATS University Islamabad Ground Floor | 004.16 JON-A (Browse shelf(Opens below)) | Available | 20557 | ||
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Junaid Zaidi Library, COMSATS University Islamabad Ground Floor | 004.16 JON-A (Browse shelf(Opens below)) | Available | 15411 |
Total holds: 0
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| 004.16 HOL-M Microcomputer fault-finding and design | 004.16 IBR-F Fuzzy logic for embedded systems applications | 004.16 JOH-K 101 killer apps for your Pocket PC | 004.16 JON-A A+ exam cram | 004.16 JON-A A+ exam cram | 004.16 KAM-E Embedded systems : architecture, programming and design / | 004.16 KAM-E Embedded systems architecture, programming and design / |
Exam 220-221; 220-222.
All.
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