Failure-free integrated circuit packages [Book] : systematic elimination of failures through reliability engineering, failure analysis, and material improvements / Charles Cohn, Charles A. Harper, [editors].

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TextSeries: McGraw-Hill professional engineeringPublication details: New York : McGraw-Hill, c2005.Description: xix, 363 p. : ill. ; 24 cmISBN:

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Item type	Current library	Call number	Status	Barcode
Books	Junaid Zaidi Library, COMSATS University Islamabad Ground Floor	621.3815 FAI (Browse shelf(Opens below))	Available	23336
Books	Junaid Zaidi Library, COMSATS University Islamabad Ground Floor	621.3815 FAI (Browse shelf(Opens below))	Available	25209
Books	Junaid Zaidi Library, COMSATS University Islamabad Ground Floor	621.3815 FAI (Browse shelf(Opens below))	Available	28599

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Previous	621.3815 ELE Electronic and photonic circuits and devices	621.3815 ELW-S Silicon micromachining	621.3815 FAI Failure-free integrated circuit packages systematic elimination of failures through reliability engineering, failure analysis, and material improvements /	621.3815 FAI Failure-free integrated circuit packages systematic elimination of failures through reliability engineering, failure analysis, and material improvements /	621.3815 FAI Failure-free integrated circuit packages systematic elimination of failures through reliability engineering, failure analysis, and material improvements /	621.3815 FLE-E An engineering approach to digital design	621.3815 FLE-E An engineering approach to digital design	Next

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