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Reflection electron microscopy and spectroscopy for surface analysis [Book] / Zhong Lin Wang.
Material type:
TextPublication details: Cambridge ; New York : Cambridge University Press, 1996.Description: xix, 436 p. : ill. ; 26 cmISBN: - 0521482666
- 620.44 20
- 620.44
| Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
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Junaid Zaidi Library, COMSATS University Islamabad Ground Floor | 620.44 WAN-R (Browse shelf(Opens below)) | Available | 24802 |
Total holds: 0
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| 620.44 FER-A Auger microprobe analysis | 620.44 SUR Surface analysis methods in materials science | 620.44 SUR Object-oriented and classical software engineering | 620.44 WAN-R Reflection electron microscopy and spectroscopy for surface analysis | 620.5 ALF-F Fundamentals of nanoscale film analysis | 620.5 ALF-F Fundamentals of nanoscale film analysis | 620.5 ALF-F Fundamentals of nanoscale film analysis |
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