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Scanning electron microscopy [Book] : physics of image formation and microanalysis / Ludwig Reimer.

By: Material type: TextTextSeries: Springer series in optical sciences ; v. 45Publication details: Berlin ; New York : Springer, c1998.Edition: 2nd completely rev. and updated edDescription: xiv, 527 p. : ill. ; 24 cmISBN:
  • 3540639764 (hardcover ; alk. paper)
Subject(s): DDC classification:
  • 502.8 25 21
Other classification:
  • 502.825
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