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Statistics for imaging, optics, and photonics / [Book] / Peter Bajorski.

By: Material type: TextTextSeries: Wiley series in probability and statistics ; 808Publication details: Hoboken, N.J. : Wiley, 2012.Description: xiv, 379 pages. : illustrations ; 25 cmISBN:
  • 9780470509456 (hardback)
Subject(s): DDC classification:
  • 621.36015195 23
LOC classification:
  • QC369 .B35 2012
Other classification:
  • 621.36015195
Summary: "This important resource bridges the gap between imaging, optics, and photonics, and statistics and data analysis. The text contains a wide range of relevant statistical methods including a review of the fundamentals of statistics and expanding into multivariate techniques. The techniques are explained in the context of real examples from remote sensing, multispectral and hyperspectral imaging, signal processing, color science, and other related disciplines. The book also emphasizes intuitive and geometric understanding of concepts. The topics that are most relevant to imaging, optics, and photonics applications are covered thoroughly. In addition, supplemental topics are discussed to provide an overview of when and how the methods can be used"-- Provided by publisher.
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Books Books Junaid Zaidi Library, COMSATS University Islamabad 621.36015195 BAJ-S (Browse shelf(Opens below)) Available 53495
Total holds: 0

Includes bibliographical references (p. 365-369) and index.

"This important resource bridges the gap between imaging, optics, and photonics, and statistics and data analysis. The text contains a wide range of relevant statistical methods including a review of the fundamentals of statistics and expanding into multivariate techniques. The techniques are explained in the context of real examples from remote sensing, multispectral and hyperspectral imaging, signal processing, color science, and other related disciplines. The book also emphasizes intuitive and geometric understanding of concepts. The topics that are most relevant to imaging, optics, and photonics applications are covered thoroughly. In addition, supplemental topics are discussed to provide an overview of when and how the methods can be used"-- Provided by publisher.

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