MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01765cam a22002775a 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
0000061660 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
0001 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
070717s2008 nyua 000 0 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783540738855 (acid-free) |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
DLC |
| Transcribing agency |
DLC |
| Modifying agency |
DLC |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
620.1 1299 |
| Edition number |
22 |
| 084 ## - OTHER CLASSIFICATION NUMBER |
|---|
| Classification number |
620.11299 |
| Item number |
FUL-T |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Fultz, B. |
| Fuller form of name |
(Brent) |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Transmission electron microscopy and diffractometry of materials |
| Medium |
[Book] / |
| Statement of responsibility, etc. |
Brent Fultz, James M. Howe. |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
3rd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Berlin ; |
| -- |
New York : |
| Name of publisher, distributor, etc. |
Springer, |
| Date of publication, distribution, etc. |
c2008. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xix, 758 p. : |
| Other physical details |
ill. ; |
| Dimensions |
24 cm. |
| 490 0# - SERIES STATEMENT |
|---|
| Series statement |
Advanced texts in physics ; |
| Volume/sequential designation |
1439-2674 |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. |
| 521 ## - TARGET AUDIENCE NOTE |
|---|
| Target audience note |
All. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Materials |
| General subdivision |
Microscopy. |
|
|---|
| Topical term or geographic name entry element |
Transmission electron microscopy. |
|
|---|
| Topical term or geographic name entry element |
X-ray diffractometer. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Howe, James M., |
| Dates associated with a name |
1955- |
| 852 ## - LOCATION |
|---|
| Piece designation |
44873 |
| -- |
6727.81 |
| Classification part |
620.11299 FUL-T |
| -- |
Book Field International |
| Sublocation or collection |
Ground Floor |
| Former shelving location |
Books |
| Copy number |
1 |
| Piece physical condition |
2-Good |
| Location |
JZL-CUI |
