Characterization of high Tc materials and devices by electron microscopy

Characterization of high Tc materials and devices by electron microscopy [Book] / edited by Nigel D. Browning, Stephen J. Pennycook. - Cambridge ; New York : Cambridge University Press, c2000. - xii, 391 p. : ill. ; 26 cm.

Includes references

All.

052155490x (hbk)


Electron microscopy Technique.
High temperature superconductors.

537.6230284